A GNR Brasil representa toda a linha de DIFRATOMETROS da Gnr , empresa italiana com mais de 30 anos de especialização.
Oferecemos instalação, garantia e assistência técnica local para todos os equipamentos comercializados.
X-Ray Diffraction (XRD) is a non-destructive technique for the qualitative and quantitative analysis of the crystalline materials, in form of powder or solid.
GNR has developed, in cooperation with academic and industrial users, a set of technically advanced and flexible diffractometers able to satisfy different level of requirements and different operating budget.
GNR XRD Product Portfolio covers a huge range of applications for materials characterization and quality control of crystalline or non-crystalline materials such as powders, specimens, thin films or liquids
Basically XRD is obtained as the “reflection” of an X-ray beam from a family of parallel and equally spaced atomic planes, following the Bragg’s law: when a monochromatic X-ray beam with wavelength l is incident on lattice planes with an angle q, diffraction occurs if the path of rays reflected by successive planes (with distance d) is a multiple of the wavelength.
Qualitative analysis (phase analysis) can be done thanks to the comparison of the diffractogram obtained from the specimen with a huge number of patterns included in the official databases. Single phases and/or mixtures of phases can be analysed with the programs available today.
- Non-destructive technique for the qualitative and quantitative analysis of the crystalline materials.
Non destructive tecnique suitable for solids, liquids, powders and alloys
TXRF is founded on the same principles of the EDXRF with, however, one significant difference. In contrast to EDXRF, where the primary beam strikes the sample at an angle of 45°, TXRF uses a glancing angle of a few milliradians.
Owing to this grazing incidence, the primary beam is totally reflected. By illuminating the sample with a beam that is being totally reflected, absorption of the beam in the supporting substrate is largely avoided and the associated scattering is greatly reduced. This also reduces the background noise substantially.
A further contribution to the reduction of the background noise is obtained by minimising the thickness of the sample. A small drop of the sample (5-100 microliters of the substance dissolved in an appropriate solvent) is placed on a silica carrier. On evaporation of the solvent a thin film, a few nanometers thick, remains.
In practice the greater part of the scattering normally arising from the sample and its matrix is eliminated. This is because matrix effect cannot build up within minute residues or thin layers of a sample. Besides its high detection power, simplified quantitative analysis is made possible by an internal standard.
The technique is generally non-destructive and its suitable for solids, liquids, powders and alloys.